Irith Pomeranz, Sudhakar M. Reddy. On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan. In 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings. pages 82-84, IEEE Computer Society, 2004. [doi]
@inproceedings{PomeranzR04:4,
title = {On Undetectable Faults in Partial Scan Circuits Using Transparent-Scan},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/iccd/2004/2231/00/22310082abs.htm},
researchr = {https://researchr.org/publication/PomeranzR04%3A4},
cites = {0},
citedby = {0},
pages = {82-84},
booktitle = {22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 11-13 October 2004, San Jose, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2231-9},
}