The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults - researchr publication

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Irith Pomeranz, Sudhakar M. Reddy. The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults. In 19th International Conference on VLSI Design (VLSI Design 2006), 3-7 January 2006, Hyderabad, India. pages 828-831, IEEE Computer Society, 2006. [doi]

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