Functional Broadside Tests with Different Levels of Reachability

Irith Pomeranz, Sudhakar M. Reddy. Functional Broadside Tests with Different Levels of Reachability. In 20th International Conference on VLSI Design (VLSI Design 2007), Sixth International Conference on Embedded Systems (ICES 2007), 6-10 January 2007, Bangalore, India. pages 799-804, IEEE Computer Society, 2007. [doi]

Abstract

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