Irith Pomeranz, Sudhakar M. Reddy. Gradual Diagnostic Test Generation Based on the Structural Distance between Indistinguished Fault Pairs. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 349-357, IEEE Computer Society, 2010. [doi]
Abstract is missing.