Identifying Tests for Logic Fault Models Involving Subsets of Lines without Fault Enumeration

Irith Pomeranz, Sudhakar M. Reddy. Identifying Tests for Logic Fault Models Involving Subsets of Lines without Fault Enumeration. In VLSI Design 2010: 23rd International Conference on VLSI Design, 9th International Conference on Embedded Systems, Bangalore, India, 3-7 January 2010. pages 39-44, IEEE, 2010. [doi]

Abstract

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