LOCSTEP: a logic-simulation-based test generation procedure

Irith Pomeranz, Sudhakar M. Reddy. LOCSTEP: a logic-simulation-based test generation procedure. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(5):544-554, 1997. [doi]

Authors

Irith Pomeranz

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Sudhakar M. Reddy

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