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Irith Pomeranz, Sudhakar M. Reddy. LOCSTEP: a logic-simulation-based test generation procedure. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(5):544-554, 1997. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: LOCSTEP: A Logic Simulation Based Test Generation ProcedureIrith Pomeranz, Sudhakar M. Reddy. ftcs 1995: 110-119 ACTIV-LOCSTEP: A Test Generation Procedure Based on Logic Simulation and Fault ActivationIrith Pomeranz, Sudhakar M. Reddy. ftcs 1997: 144-151
The following publications are possibly variants of this publication: