A diagnostic test generation procedure for synchronous sequential circuits based on test elimination

Irith Pomeranz, Sudhakar M. Reddy. A diagnostic test generation procedure for synchronous sequential circuits based on test elimination. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 1074-1083, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.