Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage - researchr publication authors

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Irith Pomeranz, Sudhakar M. Reddy. Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 289-295, IEEE Computer Society, 1998. [doi]

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