Irith Pomeranz, Sudhakar M. Reddy. Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 289-295, IEEE Computer Society, 1998. [doi]
Abstract is missing.