COMPACTEST: a method to generate compact test sets for combinational circuits

Irith Pomeranz, Lakshmi N. Reddy, Sudhakar M. Reddy. COMPACTEST: a method to generate compact test sets for combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems, 12(7):1040-1049, 1993. [doi]

Abstract

Abstract is missing.