Irith Pomeranz, Sudhakar M. Reddy, Yervant Zorian. A Test Interface for Built-In Test of Non-Isolated Scanned Cores. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 371-378, IEEE Computer Society, 2003. [doi]
Abstract is missing.