Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Ankan K. Pramanick, Sudhakar M. Reddy. On the fault coverage of gate delay fault detecting tests. IEEE Trans. on CAD of Integrated Circuits and Systems, 16(1):78-94, 1997. [doi]
Abstract is missing.