Anuj Pushkarna, Hamid Mahmoodi. Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS. In R. Iris Bahar, Fabrizio Lombardi, David Atienza, Erik Brunvand, editors, Proceedings of the 20th ACM Great Lakes Symposium on VLSI 2009, Providence, Rhode Island, USA, May 16-18 2010. pages 373-376, ACM, 2010. [doi]
Abstract is missing.