Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices

Qinsong Qian, Siyang Liu, Weifeng Sun, Hu Sun. Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices. Microelectronics Journal, 42(5):609-613, 2011. [doi]

Authors

Qinsong Qian

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Siyang Liu

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Weifeng Sun

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Hu Sun

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