Qinsong Qian, Siyang Liu, Weifeng Sun, Hu Sun. Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices. Microelectronics Journal, 42(5):609-613, 2011. [doi]
@article{QianLSS11,
title = {Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices},
author = {Qinsong Qian and Siyang Liu and Weifeng Sun and Hu Sun},
year = {2011},
doi = {10.1016/j.mejo.2011.03.011},
url = {http://dx.doi.org/10.1016/j.mejo.2011.03.011},
researchr = {https://researchr.org/publication/QianLSS11},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {42},
number = {5},
pages = {609-613},
}