SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs - researchr publication authors

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Feng Qin, Shan Lu, Yuanyuan Zhou. SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs. In 11th International Conference on High-Performance Computer Architecture (HPCA-11 2005), 12-16 February 2005, San Francisco, CA, USA. pages 291-302, IEEE Computer Society, 2005. [doi]

This author has not been identified. Look up 'Feng Qin' in GoogleThis author has not been identified. Look up 'Shan Lu' in GoogleThis author has not been identified. Look up 'Yuanyuan Zhou' in Google

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