Feng Qin, Shan Lu, Yuanyuan Zhou. SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs. In 11th International Conference on High-Performance Computer Architecture (HPCA-11 2005), 12-16 February 2005, San Francisco, CA, USA. pages 291-302, IEEE Computer Society, 2005. [doi]
@inproceedings{QinLZ05,
title = {SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs},
author = {Feng Qin and Shan Lu and Yuanyuan Zhou},
year = {2005},
doi = {10.1109/HPCA.2005.29},
url = {http://doi.ieeecomputersociety.org/10.1109/HPCA.2005.29},
researchr = {https://researchr.org/publication/QinLZ05},
cites = {0},
citedby = {0},
pages = {291-302},
booktitle = {11th International Conference on High-Performance Computer Architecture (HPCA-11 2005), 12-16 February 2005, San Francisco, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2275-0},
}