Feng Qin, Shan Lu, Yuanyuan Zhou. SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs. In 11th International Conference on High-Performance Computer Architecture (HPCA-11 2005), 12-16 February 2005, San Francisco, CA, USA. pages 291-302, IEEE Computer Society, 2005. [doi]
Abstract is missing.