Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin. Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 195-198, IEEE, 2021. [doi]

This author has not been identified. Look up 'Martin Rack' in GoogleThis author has not been identified. Look up 'Lucas Nyssens' in GoogleThis author has not been identified. Look up 'Quentin Courte' in GoogleThis author has not been identified. Look up 'Dimitri Lederer' in GoogleThis author has not been identified. Look up 'Jean-Pierre Raskin' in Google

runs on WebDSL