Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin. Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 195-198, IEEE, 2021. [doi]
@inproceedings{RackNCLR21,
title = {Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI},
author = {Martin Rack and Lucas Nyssens and Quentin Courte and Dimitri Lederer and Jean-Pierre Raskin},
year = {2021},
doi = {10.1109/ESSDERC53440.2021.9631835},
url = {https://doi.org/10.1109/ESSDERC53440.2021.9631835},
researchr = {https://researchr.org/publication/RackNCLR21},
cites = {0},
citedby = {0},
pages = {195-198},
booktitle = {51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3748-6},
}