Damu Radhakrishnan, Taejin Pyon. Fault tolerance in RNS: an efficient approach. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 41-44, IEEE, 1990. [doi]
Abstract is missing.