Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko. Untestable Fault Identification in Sequential Circuits Using Model-Checking. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 21-26, IEEE Computer Society, 2008. [doi]
@inproceedings{RaikFUK08,
title = {Untestable Fault Identification in Sequential Circuits Using Model-Checking},
author = {Jaan Raik and Hideo Fujiwara and Raimund Ubar and Anna Krivenko},
year = {2008},
doi = {10.1109/ATS.2008.22},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.22},
researchr = {https://researchr.org/publication/RaikFUK08},
cites = {0},
citedby = {0},
pages = {21-26},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}