Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko. Untestable Fault Identification in Sequential Circuits Using Model-Checking. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 21-26, IEEE Computer Society, 2008. [doi]
Abstract is missing.