The following publications are possibly variants of this publication:
- Hierarchical Identification of Untestable Faults in Sequential CircuitsJaan Raik, Raimund Ubar, Anna Krivenko, Margus Kruus. dsdm 2007: 668-671 [doi]
- Identifying Untestable Faults in Sequential Circuits Using Test Path ConstraintsTaavi Viilukas, Anton Karputkin, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Hideo Fujiwara. et, 28(4):511-521, 2012. [doi]
- Constraint-Based Hierarchical Untestability Identification for Synchronous Sequential CircuitsJaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara. ets 2011: 147-152 [doi]