An External Test Approach for Network-on-a-Chip Switches

Jaan Raik, Vineeth Govind, Raimund Ubar. An External Test Approach for Network-on-a-Chip Switches. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 437-442, IEEE, 2006. [doi]

Authors

Jaan Raik

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Vineeth Govind

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Raimund Ubar

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