An External Test Approach for Network-on-a-Chip Switches

Jaan Raik, Vineeth Govind, Raimund Ubar. An External Test Approach for Network-on-a-Chip Switches. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 437-442, IEEE, 2006. [doi]

Abstract

Abstract is missing.