Jaan Raik, Vineeth Govind, Raimund Ubar. An External Test Approach for Network-on-a-Chip Switches. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 437-442, IEEE, 2006. [doi]
@inproceedings{RaikGU06,
title = {An External Test Approach for Network-on-a-Chip Switches},
author = {Jaan Raik and Vineeth Govind and Raimund Ubar},
year = {2006},
doi = {10.1109/ATS.2006.260967},
url = {https://doi.org/10.1109/ATS.2006.260967},
researchr = {https://researchr.org/publication/RaikGU06},
cites = {0},
citedby = {0},
pages = {437-442},
booktitle = {15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006},
publisher = {IEEE},
isbn = {0-7695-2628-4},
}