Jaan Raik, Artur Jutman, Raimund Ubar. Fast static compaction of tests composed of independent sequences: basic properties and comparison of methods. In Proceedings of the 2002 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002, Dubrovnik, Croatia, September 15-18, 2002. pages 445-448, IEEE, 2002. [doi]
Abstract is missing.