A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module

Pushparajah Rajaguru, Hua Lu 0003, Chris Bailey. A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module. Microelectronics Reliability, 55(11):2371-2381, 2015. [doi]

Authors

Pushparajah Rajaguru

This author has not been identified. Look up 'Pushparajah Rajaguru' in Google

Hua Lu 0003

This author has not been identified. Look up 'Hua Lu 0003' in Google

Chris Bailey

This author has not been identified. Look up 'Chris Bailey' in Google