A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module

Pushparajah Rajaguru, Hua Lu 0003, Chris Bailey. A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module. Microelectronics Reliability, 55(11):2371-2381, 2015. [doi]

Abstract

Abstract is missing.