Pushparajah Rajaguru, Hua Lu 0003, Chris Bailey. A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module. Microelectronics Reliability, 55(11):2371-2381, 2015. [doi]
@article{Rajaguru0B15a,
title = {A time dependent damage indicator model for Sn3.5Ag solder layer in power electronic module},
author = {Pushparajah Rajaguru and Hua Lu 0003 and Chris Bailey},
year = {2015},
doi = {10.1016/j.microrel.2015.07.047},
url = {http://dx.doi.org/10.1016/j.microrel.2015.07.047},
researchr = {https://researchr.org/publication/Rajaguru0B15a},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {11},
pages = {2371-2381},
}