Microscopic scale characterization and modeling of transistor degradation under HC stress - researchr publication authors

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Yoann Mamy Randriamihaja, V. Huard, X. Federspiel, A. Zaka, P. Palestri, D. Rideau, D. Roy, A. Bravaix. Microscopic scale characterization and modeling of transistor degradation under HC stress. Microelectronics Reliability, 52(11):2513-2520, 2012. [doi]

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Pierpaolo Palestri

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