Yoann Mamy Randriamihaja, V. Huard, X. Federspiel, A. Zaka, P. Palestri, D. Rideau, D. Roy, A. Bravaix. Microscopic scale characterization and modeling of transistor degradation under HC stress. Microelectronics Reliability, 52(11):2513-2520, 2012. [doi]
Abstract is missing.