Arijit Raychowdhury, Bibiche M. Geuskens, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Tanay Karnik, Muhammad M. Khellah, Vivek K. De. Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays. J. Solid-State Circuits, 46(4):797-805, 2011. [doi]
@article{RaychowdhuryGBTLKKD11,
title = {Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays},
author = {Arijit Raychowdhury and Bibiche M. Geuskens and Keith A. Bowman and James W. Tschanz and Shih-Lien Lu and Tanay Karnik and Muhammad M. Khellah and Vivek K. De},
year = {2011},
doi = {10.1109/JSSC.2011.2108141},
url = {http://dx.doi.org/10.1109/JSSC.2011.2108141},
researchr = {https://researchr.org/publication/RaychowdhuryGBTLKKD11},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {46},
number = {4},
pages = {797-805},
}