Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays

Arijit Raychowdhury, Bibiche M. Geuskens, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Tanay Karnik, Muhammad M. Khellah, Vivek K. De. Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays. J. Solid-State Circuits, 46(4):797-805, 2011. [doi]

Abstract

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