On test data volume reduction for multiple scan chain designs

Sudhakar M. Reddy, Kohei Miyase, Seiji Kajihara, Irith Pomeranz. On test data volume reduction for multiple scan chain designs. ACM Trans. Design Autom. Electr. Syst., 8(4):460-469, 2003. [doi]

Possibly Related Publications

The following publications are possibly variants of this publication: