COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits

Lakshmi N. Reddy, Irith Pomeranz, Sudhakar M. Reddy. COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits. In ICCAD. pages 568-574, 1992. [doi]

@inproceedings{ReddyPR92,
  title = {COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits},
  author = {Lakshmi N. Reddy and Irith Pomeranz and Sudhakar M. Reddy},
  year = {1992},
  doi = {10.1145/304032.304169},
  url = {http://doi.acm.org/10.1145/304032.304169},
  tags = {testing, logic},
  researchr = {https://researchr.org/publication/ReddyPR92},
  cites = {0},
  citedby = {0},
  pages = {568-574},
  booktitle = {ICCAD},
}