COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits

Lakshmi N. Reddy, Irith Pomeranz, Sudhakar M. Reddy. COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits. In ICCAD. pages 568-574, 1992. [doi]

Abstract

Abstract is missing.