An EMI Resisting LIN Driver in 0.35-micron High-Voltage CMOS

Jean-Michel Redoute, Michiel Steyaert. An EMI Resisting LIN Driver in 0.35-micron High-Voltage CMOS. J. Solid-State Circuits, 42(7):1574-1582, 2007. [doi]

Abstract

Abstract is missing.