Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories

D. G. Refaldi, Gerardo Malavena, Luca Chiavarone, N. Gagliazzi, Alessandro S. Spinelli, C. Monzio Compagnoni. Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 1-7, IEEE, 2025. [doi]

Abstract

Abstract is missing.