Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories - researchr publication related

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D. G. Refaldi, Gerardo Malavena, Luca Chiavarone, N. Gagliazzi, Alessandro S. Spinelli, C. Monzio Compagnoni. Cryogenic Investigation of Vertical Charge Loss in 3D NAND Flash Memories. In IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025. pages 1-7, IEEE, 2025. [doi]

The following publications are possibly variants of this publication:

Experimental Segmentation of Vertical Charge Loss Mechanisms in Charge Trap-Based 3D NAND ArraysLuca Chiavarone, Gianluca Nicosia, Niccolò Righetti, Yingda Dong. irps 2024: 1-5 [doi]

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