Probabilistic Error Modeling for Nano-Domain Logic Circuits

Thara Rejimon, Karthikeyan Lingasubramanian, Sanjukta Bhanja. Probabilistic Error Modeling for Nano-Domain Logic Circuits. IEEE Trans. VLSI Syst., 17(1):55-65, 2009. [doi]

@article{RejimonLB09,
  title = {Probabilistic Error Modeling for Nano-Domain Logic Circuits},
  author = {Thara Rejimon and Karthikeyan Lingasubramanian and Sanjukta Bhanja},
  year = {2009},
  doi = {10.1109/TVLSI.2008.2003167},
  url = {http://dx.doi.org/10.1109/TVLSI.2008.2003167},
  tags = {modeling, logic},
  researchr = {https://researchr.org/publication/RejimonLB09},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {17},
  number = {1},
  pages = {55-65},
}