The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits

Yi Ren, Li Chen. The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. J. Electronic Testing, 30(3):377-382, 2014. [doi]

Authors

Yi Ren

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Li Chen

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