Yi Ren, Li Chen. The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. J. Electronic Testing, 30(3):377-382, 2014. [doi]
@article{RenC14,
title = {The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits},
author = {Yi Ren and Li Chen},
year = {2014},
doi = {10.1007/s10836-014-5448-6},
url = {http://dx.doi.org/10.1007/s10836-014-5448-6},
researchr = {https://researchr.org/publication/RenC14},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {30},
number = {3},
pages = {377-382},
}