The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits

Yi Ren, Li Chen. The Effect of Temperature-Induced Quiescent Operating Point Shift on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits. J. Electronic Testing, 30(3):377-382, 2014. [doi]

Abstract

Abstract is missing.