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William R. Reohr, Yuen H. Chan, Donald W. Plass, Antonio Pelella, Philip T. Wu. Design SRAMs for burn-in. In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 164-170, IEEE, 1993. [doi]
Abstract is missing.