3 gated MOSFET structures after electrical stress

Joel Molina Reyes, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai. 3 gated MOSFET structures after electrical stress. IEICE Electronic Express, 4(6):185-191, 2007. [doi]

Abstract

Abstract is missing.