Using Memory to Cope with Simultaneous Transient Faults

Eduardo Luis Rhod, Carlos Arthur Lang Lisbôa, Luigi Carro. Using Memory to Cope with Simultaneous Transient Faults. In 7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006. pages 151-156, IEEE, 2006.

Authors

Eduardo Luis Rhod

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Carlos Arthur Lang Lisbôa

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Luigi Carro

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