Eduardo Luis Rhod, Carlos Arthur Lang Lisbôa, Luigi Carro. Using Memory to Cope with Simultaneous Transient Faults. In 7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006. pages 151-156, IEEE, 2006.
@inproceedings{RhodLC06,
title = {Using Memory to Cope with Simultaneous Transient Faults},
author = {Eduardo Luis Rhod and Carlos Arthur Lang Lisbôa and Luigi Carro},
year = {2006},
researchr = {https://researchr.org/publication/RhodLC06},
cites = {0},
citedby = {0},
pages = {151-156},
booktitle = {7th Latin American Test Workshop, LATW 2006, Buenos Aires, Argentina, March 26-29, 2006},
publisher = {IEEE},
}